First cycle
degree courses
Second cycle
degree courses
Single cycle
degree courses
School of Science
Course unit
SCN1037879, A.A. 2019/20

Information concerning the students who enrolled in A.Y. 2019/20

Information on the course unit
Degree course Second cycle degree in
SC1174, Degree course structure A.Y. 2015/16, A.Y. 2019/20
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Degree course track Common track
Number of ECTS credits allocated 10.0
Type of assessment Mark
Department of reference Department of Chemical Sciences
E-Learning website
Mandatory attendance No
Language of instruction Italian
Single Course unit The Course unit can be attended under the option Single Course unit attendance
Optional Course unit The Course unit can be chosen as Optional Course unit

Teacher in charge CHIARA MAURIZIO FIS/03
Other lecturers ALBERTO CARNERA FIS/03

ECTS: details
Type Scientific-Disciplinary Sector Credits allocated
Core courses FIS/03 Material Physics 10.0

Course unit organization
Period First semester
Year 1st Year
Teaching method frontal

Type of hours Credits Teaching
Hours of
Individual study
Practice 1.0 12 13.0 No turn
Laboratory 4.0 48 52.0 No turn
Lecture 5.0 40 85.0 No turn

Start of activities 30/09/2019
End of activities 18/01/2020
Show course schedule 2019/20 Reg.2015 course timetable

Examination board
Board From To Members of the board
1 a.a. 2018/19 20/01/2014 30/11/2019 MAURIZIO CHIARA (Presidente)
CARNERA ALBERTO (Membro Effettivo)
DE SALVADOR DAVIDE (Membro Effettivo)

Prerequisites: Classical physics, quantum mechanics and fundamental of solid state physics. These competences are acquired during the Degree courses in Physics and Material Science.
Target skills and knowledge: Use of radiation-matter interaction to obtain information on materials, as composition, distribution depth profiles of dopants and crystalline and atomic structure. During the experiments performed in the lab the student will measure some electronic properties of materials and will obtain ionformation on the morphology of specific nanostructured surafaces. At the end of the course the student will know some experimental case studies on spectroscopic analysis and scanning probe microscopy, being able to critically discuss the results.
Examination methods: Oral: Five questions on the physical methods of materials characterization and on the experiments carried out by the students. The experimental reports produced by the students during the course will also be evaluated. The part of the exam on the lab experiments can be taken separately.
Assessment criteria: It will be tested and evaluated the skillfulness to understand the physical basis and the possible applications of physical methods for the characterization of materials, including the experimental strategies discussed and used in the course.
Course unit contents: Fundamentals of radiation-matter interaction.
Cross section.
Coulomb interaction between one ion and one nucleus, Rutherford Backscattering Spectrometry.
Energy loss of ions in matter.
Secondary ion mass spectrometry: sputtering, spectrometers, quantitative estimation of material composition and dopants.
high resolution X-ray diffraction-HR-XRD.
Electron-matter interaction: Scanning Electron Microscopy.
X-ray matter interaction.
Kinematical and dynamical theory of XRD.
Diffracted intensity in the reciprocal space.
X-ray reflectivity and related obtainable information.
X-ray Absorption Spectroscopies: EXAFS, XANES, XMCD.
X-ray Imaging.
Vis-IR absorption experiments to measure the energy gap of a semiconducor and Heynes Shockley experiment to investigate diffusion and transport phenomena of a semiconductor.
Scanning probe microscopy.
Planned learning activities and teaching methods: Lessons, tutorials and practicals at the Physics and Astronomy Dept.
Additional notes about suggested reading: Didactical slides and guides to the experiments performed in the lab.
Textbooks (and optional supplementary readings)
  • L.C. Feldman, J.W. Mayer, Fundamentals of Surface and Thin Film Analysis. New York: North-Holland: --, 1986. Cerca nel catalogo
  • P.F. Fewster, X-ray Scattering from Semiconductors. London: Imperial College Press, 2003. Cerca nel catalogo
  • E. Meyer, H. Hug, R. Bennewitz, Scanning Probe Microscopy. Berlin Heidelberg New York: Springer Verlag, 2003. Cerca nel catalogo
  • J. Als-Nielsen, D- McMorrow, Elements of Modern X-ray Physics, second edition. --: Wiley, 2010. Cerca nel catalogo

Innovative teaching methods: Teaching and learning strategies
  • Lecturing
  • Laboratory
  • Working in group
  • Loading of files and pages (web pages, Moodle, ...)

Innovative teaching methods: Software or applications used
  • Moodle (files, quizzes, workshops, ...)
  • One Note (digital ink)

Sustainable Development Goals (SDGs)
Quality Education